Morton Photonics has the internal test capabilities to measure the phase / frequency noise of ultra-low-noise lasers.  This test facility is based upon an Optiphase polarization insensitive Michelson Interferometer, an Optiphase OPD-4000 Demodulator unit and an Agilent PSA series (E4448A) microwave spectrum analyzer.  The market leading Optiphase demodulator (www.optiphase.com) is computer controlled, providing fully automated demodulation, automatic gain control and linearization of the measurement to <1% accuracy.  The test facility has been validated using a "golden standard" laser provided to Morton Photonics by the Navy, allowing absolute measurement accuracy to be achieved - validation of absolute measurement accuracy is required to allow comparison of measurement results with those taken at other facilities.  The phase / frequency noise measurements are taken automatically from the spectrum analyzer using LabView running on a local PC.

Measurements have been taken for external cavity lasers (ECL) either in a free-space setup using nanoscale positioning equipment to align the external fiber cavity to a Gain Chip (shown in photograph), or for the fully packaged ultra-low-noise lasers developed by Morton Photonics in its Navy SBIR Phase II program.